Condition monitoring features for process analysis technology

Results of the NAMUR Working Group 3.6 / ZVEI KfA Working Group

Abstract

This article demonstrates how standardised condition monitoring data facilitates the transition from schedule-based to condition-based and predictive maintenance in process analysis technology. As part of the PAT@NOA initiative by NAMUR and ZVEI, 151 condition monitoring characteristics
were defined for 18 measurement principles and standardised in the IEC Common Data Dictionary. In conjunction with PA-DIM and OPC UA, this creates a cross-vendor, interoperable basis for the automated use of instrument data. Practical examples involving omeasurements and TOC analysers
illustrate the potential for increased availability, as well as more efficient and better-planned maintenance.