Self Describing Devices

Abstract

Integration technologies have lacked features for automatic parameterization of field devices. A new approach is presented that considers the requirements that arise during engineering and device selection. It is based on existing classification systems. The mapping to the actual device parameters is defined directly in the device descriptions. These are provided by the device manufacturer and are therefore the ideal place for additional semantic information. This approach is compatible with existing devices and device descriptions and thus enables the step-by-step support of classification properties.